David M. Tex, Toshiyuki Ihara, Tetsuya Nakamura, Mitsuru Imaizumi, Takeshi Ohshima, Yoshihiko Kanemitsu
文献索引:10.1002/pip.2912
全文:HTML全文
The subcell conversion efficiencies of proton damaged samples are determined with a new optical method that does not require any electrical contacts. By measuring the excitation power dependence of time-resolved photoluminescence decays, three unique time constants are obtained. We discuss the physical meanings of the time constants, show how they can be used to determine the subcell conversion efficiencies, and compare the results with electrical measurements.
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