Effect of bond-length alternation in molecular wires

…, MA Ratner, JC Yang, TL Schull, J Naciri…

Index: Kushmerick, James G.; Holt, David B.; Pollack, Steven K.; Ratner, Mark A.; Yang, John C.; Schull, Terence L.; Naciri, Jawad; Moore, Martin H.; Shashidhar, Ranganathan Journal of the American Chemical Society, 2002 , vol. 124, # 36 p. 10654 - 10655

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Citation Number: 312

Abstract

Current-voltage (IV) characteristics for metal-molecule-metal junctions formed from three classes of molecules measured with a simple crossed-wire molecular electronics test-bed are reported. Junction conductance as a function of molecular structure is consistent with IV characteristics calculated from extended Hückel theory coupled with a Green's function approach, and can be understood on the basis of bond-length alternation.