Abstract: A low-temperature ESR study of electron-capture phosphoranyl radicals in X- irradiated single crystals of trialkylphosphine sulfides and selenides (R3PX: X= S, Se; R= CH3, C2HS, C&l,) is presented. The principal values and direction cosines of the g tensors and,'P and" Se hyperfine coupling tensors are determined and correlated with the X-ray structure analysis of the parent compounds. All studied compounds reveal the formation of ...
